TeraProbes, Inc. and F.I.Science announced today that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in France.
Under the partnership, F.I.Science will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in France. “We are very excited to offer our innovative metrology products to the EU market where there is clear and growing interest in the millimeter-wave and terahertz frequency applications. Our non-contact probe stations eliminate key issues faced with on-waver device and integrated circuit characterization, and enables users to conduct accurate, reliable, and repeatable measurements at frequencies up to and beyond 1 terahertz. With our fully-automated system, users can even characterize entire wafers without any intervention. And most important of all is: You don’t have to buy a single contact-probe ever again.”, said Kubilay Sertel, President of TeraProbes, Inc.
F.I.Science is a solutions provider of high tech instrumentation for almost 10 years, spanning radio frequency (RF), microwave, millimeter-wave and terahertz, temperature, lasers, optics, high-speed connectivity as well as test and measurement. F.I.Science offers a complete range of active and passive, coaxial and waveguide and instrumentation systems up to THz. “Our mission is to offer responsive, efficient, flexible, and creative solutions to challenging problems faced by the academic and R&D community and build together a support relationship that is sustainable, trusted and in complete confidentiality.” said Eric Cuenin, President of F.I.Science. With an added value of being recognized not only as a supplier but also as a key solution partner, F.I.Science also offers training, maintenance and repair services, as well as one-of-a-kind realizations and integrations of complex subsystems and test benches to customers in the telecommunications, electronics, semiconductors and military/space industries as well as R&D labs and Universities.
TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems readily cover 90GHz-1THz band for single-mode and pure differential-mode characterization. Our fully-automated probe stations enable uninterrupted characterization of entire wafers. For more information, please visit: www.teraprobes.com