We will be at Booth #1253 at the 2018 IMS Exhibit in Philadelphia with a live demo of our automated non-contact probe station.
Millimeter-wave and Terahertz-frequency on-wafer probing has never been so easy and effective. Witness the future of on-wafer probing with TeraProbes, Inc.
In addition, we will unveil a surprise new product that will shake up analytic probing industry. Curious? Stop by Booth #1253 and find out.